X-Ray Powder Diffraction Analysis for Crystallographic Characterization

X-Ray Powder Diffraction (XRPD) is a powerful technique used for the analysis of crystalline materials. It provides essential data on crystal structure, phase identification, and purity. XRPD is crucial for:

• Phase Identification
• Crystal Structure Analysis
• Particle Size Estimation
• Quantitative Phase Analysis
• Lattice Parameter Measurements

XRPD Process Overview

• Sample Preparation: Proper grinding and mounting of the sample to ensure a representative and random orientation of crystals.
• X-Ray Diffraction: Bombardment of the sample with X-rays and detection of diffracted beams.
• Pattern Acquisition: Collection of diffraction patterns as a function of the angle of incidence.
• Data Analysis: Interpretation of diffraction patterns to determine crystal structure, phase content, and other properties.

Applications of XRPD in Material Science

• Phase Identification: Determining the presence of different crystalline phases in a sample, essential for understanding material properties.
• Crystallography: Elucidating the crystal structure of materials for insight into physical and chemical properties.
• Particle Size Analysis: Estimating the size of crystalline regions, impacting dissolution rates and mechanical properties.
• Purity Analysis: Assessing the purity of materials by identifying and quantifying phases.

Why Choose The Solubility Company for XRPD Analysis?

• State-of-the-Art Equipment: Utilization of the latest XRPD technology for precise and reliable results.
• Professional Expertise: Our team offers specialized knowledge in solid-state science and small molecule characterization.
• Customized Services: Tailored studies to suit various needs, including research, quality control, and regulatory compliance.
• Comprehensive Data Reporting: In-depth analysis and detailed reporting for actionable insights.